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MLA Citation
Ankur Sinha et al.. “Electron diffraction characterization of nanocrystalline materials using a Rietveld‐based approach. Part II. Application to microstructural analysis.” Journal of applied crystallography, vol. 55, no. 6, 2022, pp. 1413–1423. http://access.bl.uk/ark:/81055/vdc_100172067103.0x00005f