Cite
MLA Citation
Yu-ya Gao et al.. “Molar mass measurement of a 28Si-enriched silicon crystal with high precision secondary ion mass spectrometry (SIMS).” Journal of analytical atomic spectrometry, vol. 37, no. 12, 2022, pp. 2546–2555. http://access.bl.uk/ark:/81055/vdc_100171200311.0x00005e