Cite
HARVARD Citation
Gao, Y. et al. (2022). Molar mass measurement of a 28Si-enriched silicon crystal with high precision secondary ion mass spectrometry (SIMS). Journal of analytical atomic spectrometry. 37 (12), pp. 2546-2555. [Online].
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Gao, Y. et al. (2022). Molar mass measurement of a 28Si-enriched silicon crystal with high precision secondary ion mass spectrometry (SIMS). Journal of analytical atomic spectrometry. 37 (12), pp. 2546-2555. [Online].