Monolithic TCAD simulation of phase-change memory (PCM/PRAM) + Ovonic Threshold Switch (OTS) selector device. (January 2023)
- Record Type:
- Journal Article
- Title:
- Monolithic TCAD simulation of phase-change memory (PCM/PRAM) + Ovonic Threshold Switch (OTS) selector device. (January 2023)
- Main Title:
- Monolithic TCAD simulation of phase-change memory (PCM/PRAM) + Ovonic Threshold Switch (OTS) selector device
- Authors:
- Thesberg, M.
Stanojevic, Z.
Baumgartner, O.
Kernstock, C.
Leonelli, D.
Barci, M.
Wang, X.
Zhou, X.
Jiao, H.
Donadio, G.L.
Garbin, D.
Witters, T.
Kundu, S.
Hody, H.
Delhougne, R.
Kar, G.
Karner, M. - Abstract:
- Abstract: Owing to the increasing interest in the commercialization of phase-change memory (PCM) devices, a number of TCAD models have been developed for their simulation. These models formulate the melting, amorphization and crystallization of phase-change materials as well as their extreme conductivity dependence on both electric field and temperature into a set of self-consistently-solved thermoelectric and phase-field partial-differential equations. However, demonstrations of the ability of such models to match actual experimental results are rare. In addition, such PCM devices also require a so-called selector device – such as an Ovonic Threshold Switching (OTS) device – in series for proper memory operation. However, monolithic simulation of both the PCM and OTS selector device in a single simulation is largely absent from the literature, despite its potential value for material- and design-space explorations. It is the goal of this work to first characterize a PCM device in isolation against experimental data, then to demonstrate the qualitative behavior of a simulated OTS device in isolation and finally to perform a single monolithic simulation of the PCM + OTS device within the confines of a commercially available TCAD solver: GTS Framework. Highlights: Phase-change memory (PCM) devices are important devices of commercial interest. PCM models are rarely validated against experiment. In this work a PCM model is validated against experimental pulse data. PCM devicesAbstract: Owing to the increasing interest in the commercialization of phase-change memory (PCM) devices, a number of TCAD models have been developed for their simulation. These models formulate the melting, amorphization and crystallization of phase-change materials as well as their extreme conductivity dependence on both electric field and temperature into a set of self-consistently-solved thermoelectric and phase-field partial-differential equations. However, demonstrations of the ability of such models to match actual experimental results are rare. In addition, such PCM devices also require a so-called selector device – such as an Ovonic Threshold Switching (OTS) device – in series for proper memory operation. However, monolithic simulation of both the PCM and OTS selector device in a single simulation is largely absent from the literature, despite its potential value for material- and design-space explorations. It is the goal of this work to first characterize a PCM device in isolation against experimental data, then to demonstrate the qualitative behavior of a simulated OTS device in isolation and finally to perform a single monolithic simulation of the PCM + OTS device within the confines of a commercially available TCAD solver: GTS Framework. Highlights: Phase-change memory (PCM) devices are important devices of commercial interest. PCM models are rarely validated against experiment. In this work a PCM model is validated against experimental pulse data. PCM devices also require "selector" devices in series which is often ignored. Here we consider a monolithic simulation of PCM+OTS selector device. … (more)
- Is Part Of:
- Solid-state electronics. Volume 199(2023)
- Journal:
- Solid-state electronics
- Issue:
- Volume 199(2023)
- Issue Display:
- Volume 199, Issue 2023 (2023)
- Year:
- 2023
- Volume:
- 199
- Issue:
- 2023
- Issue Sort Value:
- 2023-0199-2023-0000
- Page Start:
- Page End:
- Publication Date:
- 2023-01
- Subjects:
- Phase-change memories -- PCM -- PRAM -- TCAD -- Device modeling
Semiconductors -- Periodicals
Semiconducteurs -- Périodiques
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00381101 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.sse.2022.108504 ↗
- Languages:
- English
- ISSNs:
- 0038-1101
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8327.385000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 24462.xml