Cite
APA Citation
Sharstniou, A., Niauzorau, S., Hardison, A. L., Puckett, M., Krueger, N., Ryckman, J. D., & Azeredo, B. (2022). roughness Suppression in Electrochemical Nanoimprinting of Si for Applications in Silicon Photonics. Advanced materials, 34(43), n/a. http://access.bl.uk/ark:/81055/vdc_100169180570.0x00003b