Cite
APA Citation
Liu, X., Wang, R., Zhang, J., Lu, Y., Zhang, Y., Yang, D., & Pi, X. (2022). anisotropic deformation of 4H-SiC wafers: insights from nanoindentation tests. Journal of physics, 55, . http://access.bl.uk/ark:/81055/vdc_100169170300.0x00005e