Cite
HARVARD Citation
Liu, X. et al. (2022). Anisotropic deformation of 4H-SiC wafers: insights from nanoindentation tests. Journal of physics. p. . [Online].
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Liu, X. et al. (2022). Anisotropic deformation of 4H-SiC wafers: insights from nanoindentation tests. Journal of physics. p. . [Online].