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MLA Citation
Rudolf C. Hoffmann et al.. “Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc. Thin Film Transistor and Sensoric Behaviour of ZnO Films and Rods.” Chemistry, vol. 27, no. 17, 2021, p. 5312. http://access.bl.uk/ark:/81055/vdc_100124025506.0x00003e