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HARVARD Citation
Inge, S. et al. (2022). Analytical model based estimation of line edge roughness induced VT variability in nanowire FETs. Solid-state electronics. p. . [Online].
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Inge, S. et al. (2022). Analytical model based estimation of line edge roughness induced VT variability in nanowire FETs. Solid-state electronics. p. . [Online].