TID evaluation based on variabilities of space radiation and device failure dose in typical navigation satellite orbits. (October 2022)

• Record Type: Journal Article
• Authors: Wang, Jian-zhao; Huo, Zhuo-xi; Wang, Fang-fang
• Is Part Of: Microelectronics and reliability. Volume 137(2022)
• Publication Date: 2022-10
• Subjects: Total ionizing dose -- Radiation effect -- Geosynchronous orbit -- Medium earth orbit; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2022.114747
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Navigation satellites mainly operate in Medium Earth Orbit (MEO), Geostationary Earth Orbit (GEO), and Inclined Geosynchronous Satellite Orbit (IGSO). These orbits lie in or repeatedly cross the outer Van Allen belt of Earth. With large uncertainty, the radiation in these orbits mainly comes from electrons trapped in the outer radiation belt and solar energetic protons. The accurate design of the radiation shielding structure plays an important role in improving the efficiency of satellites. We introduce a method that incorporates the radiation variability in space and failure dose uncertainty of devices to evaluate the survival probability of devices caused by the Total Ionizing Dose (TID) effect. After fitting the failure dose data of operational amplifier TL084 by the Weibull distribution, we calculate the Confidence Levels (CLs) of all possible parameters of the distribution. Based on these parameters and the cumulative probability distribution of TID from space, we evaluate the effects of shielding thickness and mission duration on TL084's failure possibility at different CLs in MEO/GEO/IGSO. Furthermore, the required shielding thickness and the expected survival duration to ensure that TL084 could operate safely at specific CL are also investigated. By using this method, we could approach a balance among the device's ability, the shielding thickness, the expected duration of safe operation, and the confidence level of the design. Highlights: A method to evaluate the survival probability of devices caused by the total ionizing dose effect is introduced. The shielding efficiency and survival duration of TL084 at different confidence levels are investigated. This method could realize the precise design of shielding structure and achieve a balance between different factors.