Cite
MLA Citation
Han Han et al.. “Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM.” Micron, vol. 150, 2021, p. . http://access.bl.uk/ark:/81055/vdc_100142240207.0x00001d
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Han Han et al.. “Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM.” Micron, vol. 150, 2021, p. . http://access.bl.uk/ark:/81055/vdc_100142240207.0x00001d