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APA Citation
Zhang, W., Zhu, B., Wang, S., Fan, L., Fang, J., Bian, B., Li, W., & Wang, Y. (2022). surface characterization and secondary electron yield measurement of the Ti-Zr-V films deposited on laser-etched copper. Journal of instrumentation, 17, . http://access.bl.uk/ark:/81055/vdc_100161687020.0x000027