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HARVARD Citation
Zhang, W. et al. (2022). Surface characterization and secondary electron yield measurement of the Ti-Zr-V films deposited on laser-etched copper. Journal of instrumentation. p. . [Online].
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Zhang, W. et al. (2022). Surface characterization and secondary electron yield measurement of the Ti-Zr-V films deposited on laser-etched copper. Journal of instrumentation. p. . [Online].