Cite
MLA Citation
Hanbin Wang et al.. “Characteristics of 22 nm UTBB-FDSOI technology with an ultra-wide temperature range.” Semiconductor science and technology, vol. 37, 2022, p. . http://access.bl.uk/ark:/81055/vdc_100161795711.0x000002
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Hanbin Wang et al.. “Characteristics of 22 nm UTBB-FDSOI technology with an ultra-wide temperature range.” Semiconductor science and technology, vol. 37, 2022, p. . http://access.bl.uk/ark:/81055/vdc_100161795711.0x000002