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APA Citation
Ferguson, M., Najah, M., Banville, F., Boucherit, M., Miriyala, N., Renaud, J., Fréchette, L., Boone, F., Ecoffey, S., & Charlebois, S. A. (2022). mitigating Re-Entrant Etch Profile Undercut in Au Etch with an Aqua Regia Variant. Journal of the Electrochemical Society, 169(8), . http://access.bl.uk/ark:/81055/vdc_100161796217.0x000003