Cite
MLA Citation
Haidong Chen et al.. “Revisiting and improvement of thru‐reflect‐line calibration for accurate measurement of substrate integrated waveguide components.” IET microwaves, antennas & propagation, vol. 11, no. 1, 2017, pp. 29–35. http://access.bl.uk/ark:/81055/vdc_100124778079.0x00002a