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APA Citation
Heisig, T., Lange, K., Gutsche, A., Goß, K. T., Hambsch, S., Locatelli, A., Menteş, T. O., Genuzio, F., Menzel, S., & Dittmann, R. (2022). chemical Structure of Conductive Filaments in Tantalum Oxide Memristive Devices and Its Implications for the Formation Mechanism. Advanced Electronic Materials, 8, n/a. http://access.bl.uk/ark:/81055/vdc_100161800377.0x000008