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APA Citation
Bonifacio, C., Tan, S., Nowakowski, P., Ray, M., & Fischione, P. (n.d.). raman Spectroscopy and Electron Microscopy Studies of Ga FIB and Post-FIB Ar Ion Milling's Impact on Si TEM Specimens. Microscopy and microanalysis, 28, 52–53. http://access.bl.uk/ark:/81055/vdc_100159752369.0x00001d