Cite
MLA Citation
Arent Kievits et al.. “Characterization and Optimization of OSTEM; A Novel Detection Method for Single- and Multi-Beam Scanning Electron Microscopy.” Microscopy and microanalysis, vol. 28, n.d., pp. 1458–1460. http://access.bl.uk/ark:/81055/vdc_100159752369.0x000007