Cite
MLA Citation
Jeffrey Huang et al.. “Measuring Antiferromagnetism at the Angstrom Scale using 4D-STEM.” Microscopy and microanalysis, vol. 28, n.d., pp. 474–475. http://access.bl.uk/ark:/81055/vdc_100159752333.0x000008
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Jeffrey Huang et al.. “Measuring Antiferromagnetism at the Angstrom Scale using 4D-STEM.” Microscopy and microanalysis, vol. 28, n.d., pp. 474–475. http://access.bl.uk/ark:/81055/vdc_100159752333.0x000008