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MLA Citation
Alex Lin et al.. “Correlating Automated High-Throughput ADF-STEM and 4D-STEM Imaging for the Characterization of Irradiation-Induced Defects.” Microscopy and microanalysis, vol. 28, n.d., pp. 2064–2066. http://access.bl.uk/ark:/81055/vdc_100159752270.0x00001b