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APA Citation
Castioni, F., Cuesta, S., Bernier, N., Quéméré, P., Robin, E., Delaye, V., Monroy, E., & Bayle-Guillemaud, P. (n.d.). combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 nm-thick Quantum Wells. Microscopy and microanalysis, 28, 2564–2566. http://access.bl.uk/ark:/81055/vdc_100159752237.0x000046