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Castioni, F. et al. (n.d.). Combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 nm-thick Quantum Wells. Microscopy and microanalysis. pp. 2564-2566. [Online].
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Castioni, F. et al. (n.d.). Combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 nm-thick Quantum Wells. Microscopy and microanalysis. pp. 2564-2566. [Online].