Cite
MLA Citation
Oriol Gavalda-Diaz et al.. “Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope.” Microscopy and microanalysis, vol. 28, n.d., p. 2340. http://access.bl.uk/ark:/81055/vdc_100159752204.0x000038