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HARVARD Citation
Gavalda-Diaz, O. et al. (n.d.). Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope. Microscopy and microanalysis. p. 2340. [Online].
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Gavalda-Diaz, O. et al. (n.d.). Imaging Stress Induced Domain Movement and Crack Propagation by in situ Loading in the Transmission Electron Microscope. Microscopy and microanalysis. p. 2340. [Online].