A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides. (August 2022)

Record Type:
Journal Article
Title:
A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides. (August 2022)
Main Title:
A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides
Authors:
Basha, Adham
Levi, George
Amrani, Tamir
Li, Yang
Ankonina, Guy
Shekhter, Pini
Kornblum, Lior
Goldfarb, Ilan
Kohn, Amit
Abstract:
Is Part Of:
Microscopy and microanalysis. Volume 28(2022)Supplement 1
Journal:
Microscopy and microanalysis
Issue:
Volume 28(2022)Supplement 1
Issue Display:
Volume 28, Issue 1 (2022)
Year:
2022
Volume:
28
Issue:
1
Issue Sort Value:
2022-0028-0001-0000
Page Start:
774
Page End:
778
Publication Date:
2022-08
Subjects:
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:
https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:
10.1017/S143192762200352X ↗
Languages:
English
ISSNs:
1431-9276
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD Digital store
Ingest File:
22839.xml