A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides. (August 2022) - Basha, Adham; Levi, George; Amrani, Tamir; Li, Yang; Ankonina, Guy; Shekhter, Pini; Kornblum, Lior; Goldfarb, Ilan; Kohn, Amit