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APA Citation
Bhowmick, S., Hintsala, E., & Stauffer, D. (n.d.). advanced In Situ TEM Nanomechanical Testing Options with the PI-95. Microscopy and microanalysis, 28, 3174–3175. http://access.bl.uk/ark:/81055/vdc_100159751963.0x00004a
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Bhowmick, S., Hintsala, E., & Stauffer, D. (n.d.). advanced In Situ TEM Nanomechanical Testing Options with the PI-95. Microscopy and microanalysis, 28, 3174–3175. http://access.bl.uk/ark:/81055/vdc_100159751963.0x00004a