Cite
HARVARD Citation
Bhowmick, S. et al. (n.d.). Advanced In Situ TEM Nanomechanical Testing Options with the PI-95. Microscopy and microanalysis. pp. 3174-3175. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Bhowmick, S. et al. (n.d.). Advanced In Situ TEM Nanomechanical Testing Options with the PI-95. Microscopy and microanalysis. pp. 3174-3175. [Online].