Cite
APA Citation
Konishi, J., Ohsawa, T., Suzuki, S., Ishibashi, K., Ri, S., Takahashi, K., & Yamamoto, Y. (2016). electrical Properties of Al2O3 Incorporated CeO2 Thin Films Deposited by RF Magnetron Sputtering. ECS transactions, 75, 279–285. http://access.bl.uk/ark:/81055/vdc_100116293470.0x000017