Cite
APA Citation
Hüger, E., Stahn, J., & Schmidt, H. (2015). neutron Reflectometry to Measure In Situ Li Permeation through Ultrathin Silicon Layers and Interfaces. Journal of the Electrochemical Society, 162(13), A7104–A7109. http://access.bl.uk/ark:/81055/vdc_100160137807.0x00005b