Cite
HARVARD Citation
Hüger, E. et al. (2015). Neutron Reflectometry to Measure In Situ Li Permeation through Ultrathin Silicon Layers and Interfaces. Journal of the Electrochemical Society. 162 (13), pp. A7104-A7109. [Online].
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Hüger, E. et al. (2015). Neutron Reflectometry to Measure In Situ Li Permeation through Ultrathin Silicon Layers and Interfaces. Journal of the Electrochemical Society. 162 (13), pp. A7104-A7109. [Online].