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MLA Citation
J. K. Lorenz et al.. “Process Variability for Devices at and beyond the 7 nm Node.” ECS journal of solid state science and technology, vol. 7, 2018, pp. P595–P601. http://access.bl.uk/ark:/81055/vdc_100160132020.0x000009
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J. K. Lorenz et al.. “Process Variability for Devices at and beyond the 7 nm Node.” ECS journal of solid state science and technology, vol. 7, 2018, pp. P595–P601. http://access.bl.uk/ark:/81055/vdc_100160132020.0x000009