Cite
APA Citation
Pfusterschmied, G., Triendl, F., Schneider, M., & Schmid, U. (2021). impact of Ar+ bombardment of 4H–SiC substrates on Schottky diode barrier heights. Materials science in semiconductor processing, 123, . http://access.bl.uk/ark:/81055/vdc_100117934450.0x000028