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APA Citation
Deb, D., Goswami, R., Baruah, R. K., Saha, R., & Kandpal, K. (2022). role of gate electrode in influencing interface trap sensitivity in SOI tunnel FETs. Journal of micromechanics and microengineering, 32, . http://access.bl.uk/ark:/81055/vdc_100158575439.0x000025