Cite
HARVARD Citation
Deb, D. et al. (2022). Role of gate electrode in influencing interface trap sensitivity in SOI tunnel FETs. Journal of micromechanics and microengineering. p. . [Online].
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Deb, D. et al. (2022). Role of gate electrode in influencing interface trap sensitivity in SOI tunnel FETs. Journal of micromechanics and microengineering. p. . [Online].