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APA Citation
Mohamad Zaidi, U. Z., Bushroa, A., Ghahnavyeh, R. R., & Mahmoodian, R. (2019). crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films. Pigment & resin technology, 48(6), 473–480. http://access.bl.uk/ark:/81055/vdc_100157802085.0x00004d