Cite
HARVARD Citation
Mohamad Zaidi, U. et al. (2019). Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films. Pigment & resin technology. 48 (6), pp. 473-480. [Online].
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Mohamad Zaidi, U. et al. (2019). Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films. Pigment & resin technology. 48 (6), pp. 473-480. [Online].