A SiC sidewall enhanced trench JBS diode with improved forward performance. (1st July 2022)
- Record Type:
- Journal Article
- Title:
- A SiC sidewall enhanced trench JBS diode with improved forward performance. (1st July 2022)
- Main Title:
- A SiC sidewall enhanced trench JBS diode with improved forward performance
- Authors:
- Kong, Moufu
Chen, Zongqi
Gao, Jiacheng
Duan, Yuanmiao
Hu, Zewei
Yi, Bo
Yang, Hongqiang - Abstract:
- Abstract: A new high-performance sidewall enhanced trench junction barrier Schottky (SET-JBS) diode is proposed in this article. In the proposed SET-JBS diode, in addition to the Schottky contact on the top anode, the sidewall of the trenches also introduces Schottky contacts, which not only increases the Schottky contact area, but also weakens the junction field-effect transistor effect of the device, resulting in a high forward current density and a low specific on-resistance ( R on, sp ) with a small increase in reverse leakage current ( J L ). Simulation results show that the R on, sp of the proposed SET-JBS diode is reduced by 21.6%–46.7% with less than an order of magnitude increase in leakage current compared with that of the conventional trench JBS (T-JBS) diode when the trench distance is from 2.1 μ m to 1.2 μ m at the 2 μ m trench depth. And the SET-JBS diode also performs better than the trench MOS barrier Schottky (TMBS) diode when comprehensively considered the R on, sp and J L . And the figure of merit and the trade-off relationship between the R on, sp and the breakdown voltage of the proposed SET-JBS both are better than those of the conventional T-JBS diode and TMBS diode. The forward I – V analytical model of the SET-JBS is also proposed, which is in good agreement with the simulation results. All the simulation results indicate that the proposed SET-JBS diode has promising potential in power electronics applications.
- Is Part Of:
- Semiconductor science and technology. Volume 37:Number 7(2022)
- Journal:
- Semiconductor science and technology
- Issue:
- Volume 37:Number 7(2022)
- Issue Display:
- Volume 37, Issue 7 (2022)
- Year:
- 2022
- Volume:
- 37
- Issue:
- 7
- Issue Sort Value:
- 2022-0037-0007-0000
- Page Start:
- Page End:
- Publication Date:
- 2022-07-01
- Subjects:
- SiC -- trench junction barrier Schottky diode -- trench MOS barrier Schottky diode -- Schottky barrier diode -- specific on-resistance -- current density -- reverse recovery characteristic
Semiconductors -- Periodicals
621.38152 - Journal URLs:
- http://iopscience.iop.org/0268-1242/1 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-6641/ac668a ↗
- Languages:
- English
- ISSNs:
- 0268-1242
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 21945.xml