Cite
MLA Citation
C. Valdivieso et al.. “Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs.” Solid-state electronics, vol. 194, 2022, p. . http://access.bl.uk/ark:/81055/vdc_100156691896.0x00005b
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C. Valdivieso et al.. “Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs.” Solid-state electronics, vol. 194, 2022, p. . http://access.bl.uk/ark:/81055/vdc_100156691896.0x00005b