Cite
HARVARD Citation
Valdivieso, C. et al. (2022). Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs. Solid-state electronics. p. . [Online].
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Valdivieso, C. et al. (2022). Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs. Solid-state electronics. p. . [Online].