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APA Citation

    Kim, N., Lee, J., Yong, M., Yang, U., Kim, J. T., Kim, J., Weon, B. M., Kim, C. C., & Je, J. H. (2020). scanning Nanowire Probe Interferometer for Scalable Humidity Mapping. Advanced materials technologies, 5(4), n/a. http://access.bl.uk/ark:/81055/vdc_100102728460.0x000006
  
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