Cite
HARVARD Citation
Pandey, P. et al. (2022). Performance investigation of Reconfigurable–FET under the influence of parameter variability of ferroelectric gate stack at high temperatures. Microelectronics journal. p. . [Online].
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Pandey, P. et al. (2022). Performance investigation of Reconfigurable–FET under the influence of parameter variability of ferroelectric gate stack at high temperatures. Microelectronics journal. p. . [Online].