A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices. (May 2022)
- Record Type:
- Journal Article
- Title:
- A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices. (May 2022)
- Main Title:
- A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices
- Authors:
- Shqair, M.
Khatir, Z.
Ibrahim, A.
Berkani, M.
Halouani, A.
Hamieh, T. - Abstract:
- Abstract: The thermal fatigue of the bond-wire contacts at the topside interconnections of power electronic devices is one of the main reliability issues. This paper presents a new methodological approach to characterize and model the damages during aging by a combination of fracture mechanics and physicochemical approaches. The approach relies first on correlating the change of the microstructure with aging at the bond-wire contact, then on looking for possible links between the microstructure and the parameters of damage models. After reviewing the effect of the microstructure on the whole cycling process, the correlation is made by relating the driving force of the device failure which is the crack propagation to some physicochemical properties and microstructural parameters such as surface energy (γs ), grain boundary energy (γgb ), misorientation angle between neighbor grains (Δθ), plane of orientation of each singular grain, grain size and hardness values (H). This requires EBSD analysis and some post treatments. Those relationships were then used to configure the effect of the microstructure on cracks passage at the interconnection interfaces using cohesive zone models (CZM). Highlights: The work lies on a combination of a fracture mechanics approach and a physicochemical one. Relationships were built between the CZM parameters and physicochemical-microstructural properties. Based on the previously shown relationships, the manner of crack passage was identified afterAbstract: The thermal fatigue of the bond-wire contacts at the topside interconnections of power electronic devices is one of the main reliability issues. This paper presents a new methodological approach to characterize and model the damages during aging by a combination of fracture mechanics and physicochemical approaches. The approach relies first on correlating the change of the microstructure with aging at the bond-wire contact, then on looking for possible links between the microstructure and the parameters of damage models. After reviewing the effect of the microstructure on the whole cycling process, the correlation is made by relating the driving force of the device failure which is the crack propagation to some physicochemical properties and microstructural parameters such as surface energy (γs ), grain boundary energy (γgb ), misorientation angle between neighbor grains (Δθ), plane of orientation of each singular grain, grain size and hardness values (H). This requires EBSD analysis and some post treatments. Those relationships were then used to configure the effect of the microstructure on cracks passage at the interconnection interfaces using cohesive zone models (CZM). Highlights: The work lies on a combination of a fracture mechanics approach and a physicochemical one. Relationships were built between the CZM parameters and physicochemical-microstructural properties. Based on the previously shown relationships, the manner of crack passage was identified after doing some simulations. Simulations results were compared to EBSD analyses data under the same conditions, showing the compatibility between them. … (more)
- Is Part Of:
- Microelectronics and reliability. Volume 132(2022)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 132(2022)
- Issue Display:
- Volume 132, Issue 2022 (2022)
- Year:
- 2022
- Volume:
- 132
- Issue:
- 2022
- Issue Sort Value:
- 2022-0132-2022-0000
- Page Start:
- Page End:
- Publication Date:
- 2022-05
- Subjects:
- Semiconductor -- Physicochemical-microstructural -- Critical energy -- Critical stress -- Crack propagation
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2022.114516 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
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