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APA Citation
Dolabella, S., Borzì, A., Dommann, A., & Neels, A. (2022). lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects (Small Methods 2/2022). Small methods, 6(2), n/a. http://access.bl.uk/ark:/81055/vdc_100152288737.0x000003