Cite
MLA Citation
Wolfgang E. S. Unger et al.. “Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam‐based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X‐ray photoelectron spectrometers (XPS).” Surface and interface analysis, vol. 54, 2022, pp. 320–327. http://access.bl.uk/ark:/81055/vdc_100152645067.0x00004f