Cite
HARVARD Citation
Liu, Z. et al. (2022). Cause analysis of width-dependence of on-current variability in thin gate-all-around silicon nanowire MOSFET. Japanese journal of applied physics. p. . [Online].
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Liu, Z. et al. (2022). Cause analysis of width-dependence of on-current variability in thin gate-all-around silicon nanowire MOSFET. Japanese journal of applied physics. p. . [Online].