Indirect stress and air-cavity displacement measurement of MEMS tunable VCSELs via micro-Raman and micro-photoluminescence spectroscopy. (28th January 2022)
- Record Type:
- Journal Article
- Title:
- Indirect stress and air-cavity displacement measurement of MEMS tunable VCSELs via micro-Raman and micro-photoluminescence spectroscopy. (28th January 2022)
- Main Title:
- Indirect stress and air-cavity displacement measurement of MEMS tunable VCSELs via micro-Raman and micro-photoluminescence spectroscopy
- Authors:
- Tingzon, Philippe Martin
Husay, Horace Andrew
Cabello, Neil Irvin
Eslit, John Jairus
Cook, Kevin
Kapraun, Jonas
Somintac, Armando
De Leon, Maria Theresa
Rosales, Marc
Salvador, Arnel
Chang-Hasnain, Constance
Estacio, Elmer - Abstract:
- Abstract: We employ micro-Raman spectroscopy to optically infer the stress experienced by the legs of a bridge-type microelectromechanical systems (MEMS) used in high contrast gratings tunable vertical cavity surface emitting lasers (VCSELs). We then employ micro-photoluminescence (PL) spectroscopy to indirectly measure the air cavity displacement of the same MEMS structure. Results from micro-Raman showed that electrostatically actuating the MEMS with a DC bias configuration yields increasing residual stress on the endpoints of the MEMS with values reaching up to 0.8 GPa. We simulated a finite element model via Comsol Multiphysics which agrees with the trend we observed based on our micro-Raman data. Our micro-PL spectroscopy showed that change in the air cavity of the VCSEL structure resulted in a change in the full width of the PL peak emitted by the layer consisting of four pairs of distributed Bragg reflectors. The change in the full width of the PL peak was due to the change in the optical cavity induced by displacing the MEMS via externally applied bias and agrees with our transfer matrix convolution simulation. These optical characterization tools can be used for failure analysis, MEMS design improvements, and monitoring of MEMS tunable VCSEL devices for mass production and manufacturing.
- Is Part Of:
- Semiconductor science and technology. Volume 37:Number 3(2022)
- Journal:
- Semiconductor science and technology
- Issue:
- Volume 37:Number 3(2022)
- Issue Display:
- Volume 37, Issue 3 (2022)
- Year:
- 2022
- Volume:
- 37
- Issue:
- 3
- Issue Sort Value:
- 2022-0037-0003-0000
- Page Start:
- Page End:
- Publication Date:
- 2022-01-28
- Subjects:
- laser tuning -- micro-Raman spectroscopy -- micro-photoluminescence spectroscopy
Semiconductors -- Periodicals
621.38152 - Journal URLs:
- http://iopscience.iop.org/0268-1242/1 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-6641/ac4abc ↗
- Languages:
- English
- ISSNs:
- 0268-1242
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 20680.xml