A robust and write bit-line free sub-threshold 12T-SRAM for ultra low power applications in 14 nm FinFET technology. (December 2021)
- Record Type:
- Journal Article
- Title:
- A robust and write bit-line free sub-threshold 12T-SRAM for ultra low power applications in 14 nm FinFET technology. (December 2021)
- Main Title:
- A robust and write bit-line free sub-threshold 12T-SRAM for ultra low power applications in 14 nm FinFET technology
- Authors:
- Karamimanesh, Mehrzad
Abiri, Ebrahim
Hassanli, Kourosh
Salehi, Mohammad Reza
Darabi, Abdolreza - Abstract:
- Abstract: In this paper, a robust 12T-SRAM memory cell at sub-threshold voltage is designed to reduce power consumption for low power applications, that in addition to reducing power consumption can perform well at high frequencies and remain stable. For the write operation, a new method has been used that removes the write bit line and uses the supply voltage in each cell for this operation and only by applying control signals. Also, the embedded bit line is used only for read operations and reduces the activity of the bit line, and due to being floating and the way of writing, eliminates the Precharge and Write Driver circuits, so, part of the power and area consumption has been reduced. According to the techniques used, the write and read noise margin is significantly improved and the write operation become easier to perform. Also due to the existence of a separate path for the read operation, RSNM is equaled to the HSNM. The average cell power at the frequency of 100 MHz for low power applications and 0.2V supply voltage, as compared to the best previous designs, has been improved by 34.9% and the leakage power of the hold state has been reduced by 27.6% and PDP has been improved by more than 35.2%, further, the maximum operating frequency of the cell has been increased by 39.1%, while it operates with the sub-threshold voltage of 0.2V to the frequency of 2.173 GHz.
- Is Part Of:
- Microelectronics journal. Volume 118(2021)
- Journal:
- Microelectronics journal
- Issue:
- Volume 118(2021)
- Issue Display:
- Volume 118, Issue 2021 (2021)
- Year:
- 2021
- Volume:
- 118
- Issue:
- 2021
- Issue Sort Value:
- 2021-0118-2021-0000
- Page Start:
- Page End:
- Publication Date:
- 2021-12
- Subjects:
- Write bit-line free -- Sub-threshold -- Low power -- Yield -- Process variation -- FinFET
Microelectronics -- Periodicals
Microélectronique -- Périodiques
Microelectronics
Electronic journals
Journals - contents and abstracts
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621.3805 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/5877621.html ↗
http://www.sciencedirect.com/science/journal/00262692 ↗
http://www.intute.ac.uk/sciences/cgi-bin/fullrecord.pl?handle=lesa.1012319367 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.mejo.2021.105185 ↗
- Languages:
- English
- ISSNs:
- 0959-8324
- Deposit Type:
- Legaldeposit
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- British Library DSC - 5758.973000
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