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APA Citation
Niculae, A., Barros, T., Bechteler, A., Hermenau, K., Heinzinger, K., Liebel, A., Soltau, H., & Strüder, L. (n.d.). pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium. Microscopy and microanalysis, 25, 1768–1769. http://access.bl.uk/ark:/81055/vdc_100145643435.0x000040